The Challenge of Reliability in Future Complex Systems

New issues come from the advent nanometric devices: defect and fault tolerance -at the physical, circuit and most importantly at the system levelis an enabling technology for building reliable nanoelectronic systems. Semiconductor manufacturers are responding to these challenges by introducing a variety of technical innovations, including new manufacture testing methodologies, virtual testing, prediction models, CAD targeting defect, fault-tolerant nanoelectronic architectures.